IEC 60747-9 PDF

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Semiconductor devices - Discrete devices - Part Semiconductor accelerometers "IEC applies to semiconductor accelerometers for all types of products. This standard applies not only to typical semiconductor accelerometers with built-in electric circuits, but also to semiconductor accelerometers accompanied by external circuits. This standard does not or should not violate or interfere with the agreement between customers and suppliers in terms of a new model or parameters for business.

NOTE 1: This standard, although directed toward semiconductor accelerometers, may be applied in whole or in part to any mass produced type of accelerometer. NOTE 2: The purpose of this standard is to allow for a systematic description, which covers the subjects initiated by the advent of semiconductor accelerometers. The tasks imposed on the semiconductor accelerometers are not only common to all accelerometers but also inherent to them and not yet totally solved.

The descriptions are based on latest research results. One typical example is the multi-axis accelerometer. This standard states the method of measuring acceleration as a vector quantity using multi-axis accelerometers. This standard intends to provide the concepts and the procedures of calibration of the semiconductor multi-axis accelerometers which are used not only for the measurement of acceleration but also for the control of motion in the wide frequencies ranging from DC.

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IEC 60747 Series - Semiconductor Devices

If the document is revised or amended, you will be notified by email. We have no amendments or corrections for this standard. Visit our Help Pages. Back to Semiconductor Device Standards Home. The —9, easier way to work with standards. This edition includes the following significant technical changes with respect to the previous edition: You can download and open this file to your own computer but DRM prevents opening this file on another computer, including a networked server.

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IEC 60747-9 PDF

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